Charge accumulation of quantum dots at room temperature

Abstract

The accumulation of charge in InGaAs quantum dots has been measured at room temperature by the photoelectrochemical capacitance-voltage (CV) technique for the first time. A carrier per quantum dot ratio greater than four has been observed. The use of atomic force microscopy and low temperature and room temperature photoluminescence (PL) confirm the existence of quantum dots. Also, a possible excited state is indicated by room temperature PL in a sample with small quantum dots.