Characterizing waveguide T-junctions by three plane mode-matching techniques

Abstract

A rigorous method for the solution of rectangular waveguide T-junction problems is presented. The method characterizes the waveguide discontinuity three times when the side-arm of the T-junction is terminated in a short circuit with three different lengths, and hence is called the three plane mode-matching technique. Computed and measured results on the magnitude and phase of the scattering matrix elements are in excellent agreement for both E-plane and H-plane T-junctions. >