Abstract
We present a new method to measure the frequency noise and modulation response of the carrier-envelope offset (CEO) beat of an optical frequency comb that does not make use of the traditional f-to-2f interferometry. Instead, we use an appropriate combination of different signals to extract the contribution of the CEO frequency without directly detecting it. We present a proof-of-principle validation realized with a commercial Er:fiber frequency comb and show an excellent agreement with the results obtained using a standard f-to-2f interferometer. This approach is attractive for the characterization of novel frequency comb technologies for which self-referencing is challenging, such as semiconductor mode-locked lasers, microresonator-based systems, or GHz repetition rate lasers.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
