Abstract
As densities and data rates increase, accurate characterization of the read/write process becomes increasingly critical in magnetic/optical recording. In this paper, we propose an advanced synchronous characterization scheme which employs joint synchronization and characterization in data-aided mode. This is a completely adaptive approach with distinct features which make it superior to existing characterization techniques. It can work with arbitrary data patterns and it is suitable for characterizing both magnetic and optical channels. Further, because it is operating in data-aided mode, it can tolerate much larger noise and distortions compared to a nondata-aided approach. Hence, the proposed approach is well suited for read-write channels with high densities, high data-rates, and/or low signal to noise ratios.
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