Characterization of yeast strains by fluorescence lifetime imaging microscopy

Abstract

The results of fluorescence lifetime imaging microscopy of selected yeast strains were presented and the fact that the lifetime distributions can be successfully used for strain characterization and differentiation was demonstrated. Four strains of industrially relevant yeast Saccharomyces were excited at 405 nm and the autofluorescence observed within 440-540 nm. Using statistical tools such as empirical cumulative distribution functions with Kolmogorov-Smirnov testing, the four studied strains were categorized into three different groups for normal sample size of 70 cells slide(-1) at a significance level of 5%. The differentiation of all of the examined strains from one another was shown to be possible by increasing the sample size to 420 cells, which is achievable by taking the lifetime data at six different positions in the slide.