Abstract
Measurement of the third harmonic component in the ac magnetic response was used to investigate the multiphase nature of Y-Ba-Cu-O thin films grown epitaxially on single-crystal wafers of SrTiO3. Films prepared by electron beam evaporation and by activated reactive evaporation techniques exhibit several peaks in the harmonic amplitude versus temperature, indicating multiple phase transitions. The film prepared by laser ablation technique exhibits a sharp single peak, indicating a single phase transition. These results, corroborated by x-ray diffraction and x-ray photoelectron spectroscopy, demonstrate the usefulness of third harmonic measurements in characterizing thin-film samples.
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