Abstract
A combination of X-ray tomography and electron backscatter diffraction (EBSD) was applied to investigate both the shape of voids and the plastic deformation around voids in an Al single crystal shock-loaded in the <1 2 3> direction. The combination of these two techniques allows the addition of crystallographic information to X-ray tomography and allows the addition of three-dimensional information to EBSD data. It is found that the voids are octahedral with {1 1 1} faces and that regular patterns of lattice reorientation exist around individual voids. The results provide new insights to the process of void growth during shock loading, which is important for both civil and military applications.
Highlights
Ductile fracture of metals characterizes their mechanical behavior and is of importance for their application in society
In the present work we applied a unique combination of X-ray tomography and electron backscatter diffraction (EBSD) to investigate voids in an Al single crystal shock loaded in the orientation
By combining X-ray tomography with EBSD, the geometry of the void shape was measured in the coordinate system of the single crystal, revealing that the faces of the octahedral voids are on {1 1 1} planes of the single crystal and that the axes connecting opposite vertices of the octahedrons are along the directions
Summary
Ductile fracture of metals characterizes their mechanical behavior and is of importance for their application in society. Ductile fracture is known to occur via nucleation, growth and coalescence of voids [1,2,3], phenomena which have been investigated by analytical and numerical modelling. In the present work we applied a unique combination of X-ray tomography and electron backscatter diffraction (EBSD) to investigate voids in an Al single crystal shock loaded in the orientation. This crystal has been examined previously by polychromatic X-ray microdiffraction [19]. In the present study new insights were obtained by combining three-dimensional (3D) information (tomography) with a crystallographic analysis in two dimensions (EBSD)
Sign-in/Register to view highlights & summary Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: IOP Conference Series: Materials Science and Engineering
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
