Characterization of variability and relationships among components of partial resistance to leaf rust in CIMMYT bread wheats

Abstract

A study of spring bread wheat (Triticum aestivum) germ plasm developed at the International Maize and Wheat Improvement Center (CIMMYT) showed highly significant phenotypic variability for each component of partial resistance (namely, uredial appearance period, latency period, uredial number and uredial size) to Puccinia recondita f. sp. tritici. All of the wheat genotypes displayed longer uredial appearance and latency periods and decreased uredial number and uredial size when compared to the susceptible check cultivar 'Morocco'. Positive correlations between uredial appearance period and latency period, and uredial number and uredial size, and negative correlations between uredial appearance and latency periods and uredial number and uredial size, inclusive, suggested that the components of partial resistance were either tightly linked or under pleiotropic genetic control. Compared to 'Morocco', all entries had slow disease progress in the field and variation occurred in the germ plasm for the area under the leaf rust progress curve. Disease progress was negatively correlated with uredial appearance and latency periods, whereas a positive correlation was observed with uredial number and uredial size. Certain genotypes displayed high levels of partial resistance resulting in low disease incidence in the field.