Characterization of two‐dimensional materials from Raman spectral data

Abstract

AbstractTwo‐dimensional materials like graphene and transition metal dichalcogenides materials such as WS2 and MoS2 are an attractive material platform for optoelectronics devices, photovoltaics, and strain‐induced deterministic single‐photon sources due to high carrier mobility, tunable band gap, and ease of transfer on the desired substrates. In many of these applications, knowing the number of layers is important; for example, only strained monolayer of WSe2 emits single photons at 4.5 K. Here, we present an analytical tool based on open‐source Python modules to determine the number of layers (accurately, up to five layers) by analyzing Raman spectral data. Using the data from spatially resolved Raman measurements on a two‐dimensional material and this tool, the sample morphology in terms of a number of layers can be preliminarily determined.