Abstract

It is well-known that optical transparence and electric resistance have a trade-off relationship in transparent electrodes. For this reason, developing methods to predict this relation have been important in various fields of academic research as well as for industrial applications. Herein, we suggest a simple method which reveals the relationship between optical transparence and electric resistance using MATLAB, based on the geometric characteristics of a random metal network. Ag metal-mesh transparent electrodes were fabricated with various conditions using colloidal silica cracked-templates and a Radio Frequency (RF) sputtering system. MATLAB software was used to analyze structural images of the Ag mesh network, automatically quantifying the density and width of the Ag meshes. From these data, the transparency and sheet resistance values of the Ag mesh electrodes were predicted and compared with measured values. Regarding transparency, the introduction of fitting parameters revealed minimal differences between the experimental and predicted values obtained from the structure images. Although the predicted sheet resistance was slightly different than the real measured values due to atomic defects or imperfections in the crystals of the Ag-mesh network, it was possible to observe a similar trend between the measured and predicted sheet resistances with changes in the fractional coverage area of the Ag-mesh network.

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