Abstract
The two complementary techniques of positron lifetime spectroscopy and x-ray diffraction have been applied to the structural characterization of commercial titanium nitride hard coatings grown by hollow cathode arc evaporation. Use of a pulsed positron beam allows the layers to be analysed more or less independently of the substrate. The layers are found to consist of a single delta -phase TiN, with pronounced texture and residual stress. The dominant defects appear to be grain boundaries with a positron lifetime of 225 ps. Values for the bulk positron lifetime and diffusion coefficient are also obtained.
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