Abstract
In the present work PMMA thin films by using different concentration of TiO2 as dopant were prepared. The films have been prepared by using solution cast method. The prepared films were characterized by X-ray diffraction (XRD) study. The XRD result shows that the film structure was changed from amorphous to crystalline nature by increasing the TiO2 doping concentration. The calculated crystallinity index of the TiO2 doped PMMA varied from 15.37% to 33.80% as the concentration is increased.
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