Characterization of Thin Polymer Films on the Nanometer Scale with Confocal Raman AFM

Abstract

AbstractThe combination of an atomic force microscope (AFM) with a Confocal Raman Microscope (CRM) has been used to study the composition of various thin films of polymer blends. The high spatial resolution of the AFM enables the morphological characterization of the polymer blends on the nanometer scale. Furthermore, when operating the AFM in Digital Pulsed Force Mode (DPFM), topographic information and local stiffness can be simultaneously recorded. This allows the material‐sensitive characterization of heterogeneous materials. Thin films where PMMA (at room temperature a glassy polymer) is blended with two different styrene‐butadiene rubbers are investigated. The presence of PMMA in both phase‐separated thin films allows the comparison of the mechanical properties of the two different rubber phases using DPFM‐AFM. When PMMA is blended with PET due to their similar mechanical properties (both are in the glassy state at room temperature) the assignment of the two phases to the corresponding polymers by AFM is rather difficult. Here, Raman spectroscopy provides additional information on the chemical composition of materials. In combination with a confocal microscope, the spatial distribution of the various phases can be determined with a resolution down to 200 nm. Therefore, the topographically different structures observed in AFM images can be associated to the chemical composition by using the Confocal Raman Microscope (CRM).