Abstract
Thin films of were grown by flash evaporation. The influence of the substrate temperature during film deposition on the properties of the thin films was examined. films were structurally characterized by the grazing incidence x-ray diffraction (GIXD) technique. Investigation by this technique demonstrates that the surface of thin films of prepared by flash evaporation at exhibits the chalcopyrite structure with additional binary compounds in the surface. However, in the volume the films exhibit the chalcopyrite structure only; no foreign phases were observed. X-ray reflectometry was utilized to evaluate the critical reflection angle of which permitted us to calculate the density of the films to be . The evaporated films were p type and the films deposited at had a resistivity in the range 0.3 - . From optical measurements we have determined the optical energy gap and the effective reduced mass .
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