Abstract
We investigated the characterization of mixed and annealed Y Ba Cu O superconductors with T c of around 90 K by scanning electron microscopy (SEM) with an energy dispersive X-ray system (EDS) for 99.99% (4N) and 99.995% (4N5) purity. EDS was perforned to investigate the composition on the surface of the specimens. Also, the chemical composition was analysed by inductively coupled plasma emission spectroscopy (ICP) for the 4N and 4N5 specimens. Y : Ba : Cu characterization results of EDS and ICP for 4N and 4N5 are as follows. For 4N: 14,418:35.173:50.409 at% (EDS); 17.3: 33.5: 49.1 at% (ICP). For 4N5: 15.468: 36.081: 48.452 at% (EDS); 16.6: 32.7: 50.5 at% (ICP).
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