Abstract
The in-depth chemistry of a Ti/SnO2-Sb2O5 anode was investigated by X-ray photoelectron spectroscopy combined with ion etching. The coating was found to be composed of multiple layers of tin and titanium oxides and composition gradients at both the oxide-air and oxide-metal interfaces. The existence of such an extensive titanium oxide layer may be related to the fabrication of the Ti/SnO2-Sb2O5 anode and subsequent inter-diffusion of species. Also, the surface tin oxide layer was found to be non-stoichiometric, which, in relation to the extensive titanium oxide structure, could be explained by a migration of oxygen toward the Ti substrate. Electrochemical tests showed that the film was unstable and continued to grow under anodic polarization. Impedance spectroscopy displayed a continuum in the dielectric relaxation time constants with depth. This variation in relaxation time constants was proposed to be caused by the continuous variation of the composition in the film.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
