Abstract
The possibility of determining the linear optical response tensor of a multiple quantum well (MQW) structure from optical reflection spectra is discussed. Taking into account local-field effects, the optical parameters of the MQW system are derived directly from the sheet conductivity tensor of the individual quantum well. For an amorphous Si/SiO 2 MQW structure deposited on a crystalline Si substrate, both s- and p-polarized reflection spectra were measured at different angles of incidence in the near-infrared and visible frequency regions. It was shown that the s-polarized spectra can be characterized by means of only one (complex) parameter, whereas in general it is impossible to account for the p-polarized spectra parametrically in a full range of angles of incidence even with four angular independent parameters. Finally, it was demonstrated that Feibelman's d-parameters can only be used to describe the experimental spectra at near-normal and grazing angles of incidence.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
