Year-end Sale % OFF 
Abstract
The radiation hardness of a Charge Coupled Device (CCD) technology was characterized with respect to ionizing irradiation. Image sensors and their associated drop-in structures were exposed to ?-rays up to a total dose of 90 krad(Si). In this paper results on CCD's and test structures are presented and the degradation phenomena are discussed.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
