Abstract

Coupling coefficients of various grating types and strengths are calculated from measurements of the complex reflectivity using an applied thermal chirp and optical frequency domain reflectometry (OFDR). The complex reflectivity is then utilized by a layer peeling algorithm to determine the coupling coefficient of the thermally chirped grating. A guess of the temperature profile enables the coupling coefficient of the unchirped grating to be estimated. An iterative algorithm is then used to converge on the exact coupling coefficient, employing an error minimization method applied to the reflectivity spectra. This technique removes the need for a reference grating while preserving the spatial resolution obtained with the initial OFDR measurement. Successful reconstruction of gratings with integrated |κ|L ~ 9.0 are demonstrated with a spatial resolution of less than 100 μm.

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