Abstract
Backscattering of silica-based glass waveguides is characterized for the first time to our knowledge by using an interferometric optical time-domain reflectometry system. High spatial resolution, as short as 15 microm, is obtained by using a newly developed 1.3-microm-wavelength superluminescent diode. Scattering centers produced by waveguide irregularities are clearly observed in glass optical waveguides. Waveguide loss and bend loss in the curved regions are estimated from the backscattered light intensity distribution.
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