Abstract
Electronic and structural properties of SiC powders and whiskers are characterized by means of Raman spectroscopy from the microscopic point of view. The Raman spectroscopy is a very convenient method to determine the polytype of SiC particles. A high density of free carriers with a very short mean free path is present in SiC powder made from polycarbosilane and commercial SiC whiskers. An appreciable amount of strain may exist in SiC whiskers produced commercially.
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