Characterization of Seamless CdTe Photon Counting X-Ray Detector

Abstract

Spectrally selective X-ray imaging provides improved material and tissue discrimination in comparison with the state-of-the-art dual energy technologies that are commonly used in medical, industrial, and security applications. Cadmium telluride (CdTe)- and cadmium zinc telluride (CdZnTe)-based line scanners and small size two-dimensional X-ray sensors are emerging to the market, but the need for large-scale panels is axiomatic. In this study, a seamless CdTe tile was developed that enables the implementation of large-sized, energy selective X-ray detector panels. The developed tile consists of a $64\times64$ pixel array (with $150~\mu \text{m}$ pitch) with a necessary substrate, ASIC, and CdTe crystal. The performance of the constructed seamless tile was characterized by focusing on spectral resolution and stability. In addition, a simple pixel trimming method that automates the equalization of each energy selective pixel was developed and analyzed. The obtained results suggest that the proposed concept of seamless (tileable) detector structures is a feasible approach to scale up panel sizes. The seamless tile shows comparable spectral resolution and stability performance with commercial CdTe sensors. The effect of tile to tile variation, the realization of a large-scale panel, as well as the charge sharing performance were left out of the scope and are to be studied in the next phase.