Characterization of reactively sputtered iron oxide thin films for developing magnetic resonance imaging contrast agents

Abstract

This paper reports the characterization of reactively sputtered iron oxide thin films for their application in a novel class of top-down engineered contrast agent particles for multispectral magnetic resonance imaging (MRI). Tunable saturation magnetic polarizations (J <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">S</sub> ) of iron oxide thin films ranging from approximately 0.05 to 0.2 emu/mg were achieved by adjusting sputtering parameters. The iron oxide thin films were characterized using energy-dispersive X-ray spectroscopy (EDX), X-ray diffraction (XRD), and superconducting quantum interference (SQUID) magnetometry to study their chemical compositions, crystalline structures, and magnetic property, respectively. A novel MRI contrast agent was fabricated using the iron oxide deposition parameters to achieve a desired J <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">S</sub> ; these particles were subsequently validated using MRI.