Abstract
Characterization of point defects in GaN
Full Text
Sign-in/Register to access full text options
Published version (Free)
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
https://doi.org/10.11470/oubutsu.82.10_862
Copy DOIJournal: Oyo Buturi | Publication Date: Jan 1, 2013 |
License type: partially-free |
Characterization of point defects in GaN
Join us for a 30 min session where you can share your feedback and ask us any queries you have