Abstract
As a semiconductor material, magnesium cadmium telluride (CdMgTe) crystal is considered to be an ideal room temperature X-ray, α-ray and γ-ray detector due to its unique advantages. In this paper, physical and optical properties of the crystal were mainly characterized by density, microhardness, Raman spectrum and photoluminescence (PL) spectrum. The results indicated that the densities of two crystals were 5.339 g cm−3 (Cd-excess) and 5.535 g cm−3 (Te-rich), respectively. The microhardness (Hv) of the crystals were 0.4045 GPa (Cd-excess) and 0.4156 GPa (Te-rich), respectively. Compared with CdZnTe and CdMnTe, CdMgTe had smaller fracture toughness, higher brittleness and lower yield strength. There were near hexagonal Te inclusions with size of 1.9 μm–9.4 μm in both crystals. The presence of Te inclusions and their surrounding stress distribution were determined by SEM and Raman scattering spectroscopy. ICP-MS measurements revealed that the main impurities were concentrated in the tail region of the ingots. PL spectra test indicated that the middle of the ingots had the best crystal quality. The week (D0,X) peak and strong Dcomplex peak in both ingots showed an obvious self-compensating effect.
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