Abstract
Annealed proton exchanged (APE) LiNbO3 waveguides with recovered electro-optic/nonlinear coefficients and low propagation loss are widely used in integrated optics. Although it is known that the PE LiNbO3 waveguides have higher resistance to photorefractive damage than Ti- diffused LiNbO3 waveguides1), a feature which is quite attractive for nonlinear guided wave applications such as efficient diode laser doubling2), a quantitative characterization of photorefractive effect in APE LiNbO3 waveguides in the visible region has not yet been reported.
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