Abstract
The combination of scanning electrochemical microscopy (SECM) With atomic force microscopy (AFM) requires a combined scanning probe tip. In order to add the functionality of SECM, submicro- and nanoelectrodes have been integrated into AFM tips, using focused ion beam (FIB) based microfabrication techniques. Meeting the requirements for SECM measurements, needs to integrate the electroactive area within a certain working distance recessed form the apex of the AFM tip. Furthermore, a pinhole-free insulating layer is a major prerequisite for simultaneous topographical and electrochemical imaging applications. Parylene C was successfully applied for the insulation of the combined scanning probe tips. Cyclovoltarnmetry was performed, in order to characterize the electrochemical properties. Furthermore, FIB microfabrication procedures benefit from the advantageous properties of Parylene towards manufacturing integrated nanoelectrodes.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
