Abstract
The attenuated total reflectance (ATR) method characterizes near-surface areas. Dichroic measurements on anisotropic samples provide information on the spatial orientation of molecular groups. A new rot-step ATR technique allows the rotation of sample and ATR element in small steps Δφ around the normal axis and delivers the spectral features −ln R TE,TM(φ) from which absorption indices k x,y,z and orientation parameters f x,y,z can be calculated. Advantages of this technique are shown in measurements on uniaxially drawn poly(vinylidene fluoride) in the range 1500-400 cm −1.
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