Characterization of orientational order in π-conjugated molecular thin films by NEXAFS

Abstract

Enabled by the improved availability of synchrotron facilities, near-edge X-ray absorption fine structure (NEXAFS) spectroscopy has become a widely used technique, especially due to its tunable, potentially very high, surface-sensitivity and its capability of analyzing the electronic structure of unoccupied orbitals. In this article we describe the fundamentals and technical requirements for NEXAFS spectroscopy with special focus on its application to the structural characterization of organic thin films. Based on prominent examples we discuss typical experimental applications of this technique and their characteristics compared to complementary methods. Since the evaluation of NEXAFS measurements is not straight-forward and allows for objectionable misinterpretations, we discuss numerous parasitic and often unattended effects which complicate the reliable analysis of NEXAFS spectra. Especially for the case of orientation determinations by means of NEXAFS using dichroisms analyses, the effects of molecular geometry and crystal packing motifs are elucidated in detail to provide a comprehensive picture on potential obstacles which often occur during the study of organic thin films.