Abstract
In this study, the gentle SIMS (G‐SIMS) method has been applied to organic solar cell materials. Various primary ion conditions were used to generate the G‐SIMS spectra; monoatomic and cluster sources with different energies were tested. It is shown that the G‐SIMS concept helps to identify both PCBM and P3HT materials through the enhancement of molecular and characteristic ions of the two molecules. Copyright © 2012 John Wiley & Sons, Ltd.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
