Characterization of organic photovoltaic devices using femtosecond laser induced breakdown spectroscopy

Abstract

The potential of laser induced breakdown spectroscopy (LIBS) as a non-contact probe, for characterizing organic photovoltaic devices during selective laser scribing, was investigated. Samples from organic solar cells were studied, which consisted of several layers of materials including a top electrode (Al, Mg or Mo), organic layer, bottom electrode (indium tin oxide), silicon nitride barrier layer and substrate layer situated from the top consecutively. The thickness of individual layers varies from 115 to 250nm. LIBS measurements were performed by use of a 40 femtosecond Ti:Sapphire laser operated at very low pulse energy (<10micro-joule) to ensure a fine depth-profiling of the very thin layers. Probing a fixed spot on the sample with successive laser pulses, produced plasma emission spectra corresponding to individual laser ablation events. This enabled discrimination of the different layers on the basis of characteristic spectral lines reflecting key elemental constituents of each layer in the organic solar cell structure, demonstrating the potential of LIBS for fast, non-contact characterization of organic photovoltaic coatings.