Abstract
In this work it was shown the applicability of the spectroscopic ellipsometry technique for characterization of an optically inhomogeneous polymer film with silver NPs. The histogram of silver NPs distribution based on SEM images shows the largest number of NPs have a size in the range 15-35 nm and the filling factor as large as 6%. By using the possibilities of ellipsometry it was suggested a 3-layer inhomogeneous structure with different sizes of silver NPs covered by thin polyamide-6 film. Also existence of localized plasmon resonance in such NPs was observed by optical absorption measurements.
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