Abstract
We present a new method for the characterization of molecular orientation in polymer materials based on the determination of the optical anisotropy by reflectance difference spectroscopy (RDS). Data interpretation is quite straightforward even in the case of thin transparent films, as shown for the example of biaxially oriented poly(ethylene terephthalate) (PET). A comparison with birefringence data obtained by spectroscopic ellipsometry (SE) demonstrates the superior measurement precision and robustness of RDS. Using azimuth dependent RDS, the position of the optical eigenaxes in the film plane can be established, which are found to coincide with the crystalline orientation determined by wide-angle X-ray scattering.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
