Abstract
AbstractA method for measuring the spatial profiles of the second‐order non‐linear susceptibility χ(2)(z) in the bulk of periodically poled crystals and other structures was developed. The method is based on the general relation between the Fourier harmonics of χ(2)(z) and the parametric signal lineshape in the ω− k space which is governed by the dependence of the output signal intensity on the phase mismatch. The special cases of non‐linear interferometers, periodically poled crystals with stepwise or smoothed space χ(2)(z) profiles and Fibonacci‐type non‐linear superlattices were considered. Experimental schemes based on spontaneous parametric down‐conversion and the second harmonic generation were compared and discussed. Copyright © 2005 John Wiley & Sons, Ltd.
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