Characterization of NiTi Shape Memory Wires by Differential Scanning Calorimetry and Transmission X-ray Diffraction

Abstract

AbstractThe reversible transformations between the Austenite (A) and Martensite (M) phases of NITI shape memory wires having a 78°C austenlte finish temperature (950°C annealed) were studied In the cold work and heat treatment ranges between 14 to 62% and 400 to 525°C respectively. The ranges of peak Transformation Temperatures (TI), determined by Differential Scanning Calorimetry (DSC) at a 10°C/min rate, were found to be 56 to 75°C, -28 to 33°C, and 38 to 52°C for the respective high temperature A, low temperature M, and the Intermediate Rhombohedral (R) phases. The degree of cold work and heat treatment had significant effects on the TT of NITI wires. The peak TT of A and M decreases with Increasing cold work. Except for the 14% cold worked wires, the peak TT Increases with Increasing heat treatment temperature for M, and Increases with Increasing heat treatment temperature for A for temperatures higher than 450°C. The peak IT of R Increases with Increasing cold work and decreasing heat treat temperature.Using MoKα radiation, transmission x-ray diffraction analysis was utilized to determine the phases at room temperature on wires thinned down to 0.05 to 0.01 mm in diameter. The diffraction patterns of body-centered cubic austenite (132) and monodlinic martenslte (B19) for NITi were both Identified. In addition, extra diffraction lines observed for various samples were tentatively assigned to M and the Intermediate R-phase. Depending on the thermal history and the processing conditions, the NITI wires consist of either a pure M, a mixture of A and R, or a mixture of A, R, and M at room temperature.