Abstract
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) and X-ray photoelectron spectroscopy (XPS) are well established surface techniques that provide both elemental and organic information from several monolayers of a sample surface, while also allowing depth profiling or image mapping to be carried out. The static TOF-SIMS with improved performances has expanded the application of TOF-SIMS to the study of a variety of organic, polymeric and biological materials. In this work, TOF-SIMS, XPS and Fourier Transform Infrared (FTIR) measurements were used to characterize commercial natural dyes and traditional silk fabric dyed with plant extracts dyes avoiding the time-consuming and destructive extraction procedures necessary for the spectrophotometric and chromatographic methods previously used. Silk textiles dyed with plant extracts were then analyzed for chemical and functional group identification of their dye components and mordants. TOF-SIMS spectra for the dyed silk fabric showed element ions from metallic mordants, specific fragment ions and molecular ions from plant-extracted dyes. The results of TOF-SIMS, XPS and FTIR are very useful as a reference database for comparison with data about traditional Korean silk fabric and to provide an understanding of traditional dyeing materials. Therefore, this study shows that surface techniques are useful for micro-destructive analysis of plant-extracted dyes and Korean dyed silk fabric.
Highlights
Organic dyes are very significant materials in archaeological remains
Reference silk textiles were prepared with commercial natural dyes and were characterized by Fourier Transform Infrared (FTIR), X-ray photoelectron spectroscopy (XPS) and TOF-SIMS
The analysis of silk fabric dyed with natural extracts from plants by traditional dyeing processes proved the usefulness of the reference data, which were compiled from the results of systematic testing on dyed silk fabric with commercial natural dyes
Summary
Organic dyes are very significant materials in archaeological remains. Investigation of the coloring materials used on ancient textiles provides a historical window to understanding the surrounding environment, the living style and the technological skill in ancient times [1,2,3,4]. Chemical research in the field of the analytical separation and spectrometric identification of organic dyes has been performed and studies have presented a new chromatographic scheme for the identification of certain dyes [8]. In this study, comparing to the conventional FTIR technique, to avoid extraction and to use minimum sample amount, surface analytical techniques, such as TOF-SIMS and X-ray photoelectron spectroscopy (XPS), were used to detect natural dyes in silk fabric. TOF-SIMS has been found to be an ideally suited analytical technique to characterize surface compositions and structures, because it provides elemental and molecular information about the surface layers with a high degree of sensitivity, mass resolution and special resolution [19]. A complementary analysis of various natural dyes and silk fabric dyed with plant extracts was performed by TOF-SIMS, XPS and FTIR
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