Abstract
Journal Article Characterization of Nanoparticle Films and Structures Using Focused Ion Beam Milling and Transmission Electron Microscopy Get access C R Perrey, C R Perrey Department. of Chemical Engineering and Materials Science, University of Minnesota 421 Washington Avenue S.E., Minneapolis, MN 55455-0132 Search for other works by this author on: Oxford Academic Google Scholar C B Carter, C B Carter Department. of Chemical Engineering and Materials Science, University of Minnesota 421 Washington Avenue S.E., Minneapolis, MN 55455-0132 Search for other works by this author on: Oxford Academic Google Scholar P G Kotula, P G Kotula Sandia National Laboratories, Albuquerque, NM 87185-0886 Search for other works by this author on: Oxford Academic Google Scholar J R Michael J R Michael Sandia National Laboratories, Albuquerque, NM 87185-0886 Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 8, Issue S02, 1 August 2002, Pages 1144–1145, https://doi.org/10.1017/S1431927602103795 Published: 01 November 2002
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