Characterization of Nanoparticle Films and Structures Using Focused Ion Beam Milling and Transmission Electron Microscopy

Abstract

Journal Article Characterization of Nanoparticle Films and Structures Using Focused Ion Beam Milling and Transmission Electron Microscopy Get access C R Perrey, C R Perrey Department. of Chemical Engineering and Materials Science, University of Minnesota 421 Washington Avenue S.E., Minneapolis, MN 55455-0132 Search for other works by this author on: Oxford Academic Google Scholar C B Carter, C B Carter Department. of Chemical Engineering and Materials Science, University of Minnesota 421 Washington Avenue S.E., Minneapolis, MN 55455-0132 Search for other works by this author on: Oxford Academic Google Scholar P G Kotula, P G Kotula Sandia National Laboratories, Albuquerque, NM 87185-0886 Search for other works by this author on: Oxford Academic Google Scholar J R Michael J R Michael Sandia National Laboratories, Albuquerque, NM 87185-0886 Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 8, Issue S02, 1 August 2002, Pages 1144–1145, https://doi.org/10.1017/S1431927602103795 Published: 01 November 2002