Abstract
Currently, for extraction and collimation of proton beam at the large accelerators bent silicon single crystals are used. Recently the new device for multiple deflection of the proton beam was developed, it consists of several bent strips of silicon in the reflection mode. In the device the successive bending of silicon strips at the surface of a thick plate is achieved due to internal stresses in the material of the crystal due to the Twyman effect as a result of applying mechanical grooves. Method of X-ray topography at synchrotron radiation with angular scanning was applied for measurement of bending of the individual strips of the deflector and the crystal as a whole. The results of the measurement are compared with the results obtained in the proton beam.
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