Abstract
Makyoh, the “Magic Mirror” is a very useful tool with which to visualize local irregularities of the surface of a mirror-like polished silicon wafer. Using the Makyoh method, bright and dark spots are visible in the image of wafers projected on an instrument screen. However, these spots have not yet been correlated to specific defects on a wafer surface. First, local convex-type defects on the mirror-like surface of silicon wafers are observed with Makyoh, a flatness tester and other micro surface measurement systems. Next, we report our attempts to create actrual convex and concave shapes on silicon wafer surfaces by intentionally varying polishing conditions, and which shapes are observed. We also discuss the relationship between silicon wafer flatness and the Makyoh magic mirror image.
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