Abstract
We have developed a particle analyzer system, the model PT1000, which analyzes particulates using helium microwave-induced plasma. The PT1000 can simultaneously measure the three-dimensional components, composition and size of individual particles without requiring any preparatory treatment. Applied to the evaluation of toner particles, the PT1000 enables changes in toner properties, that could not be identified with any other techniques, to be measured with high sensitivity. This paper discusses the correlation between variations in toner particle properties and analysis results using the PT1000, and presents the results of example measurements using new methods of analyzing property changes during the photodeveloping process and so on.
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