Abstract
Characterizing irradiation-induced defects is essential to understand damage mechanisms and develop irradiation-resistant materials. Prevailing strategies rely on transmission electron microscopy (TEM) observations which require rigorous prerequisite to prepare high-quality foils, making it difficult for rapid screening of irradiation-resistant materials. Here, we propose that the electron channeling contrast imaging (ECCI) is expected to provide a novel strategy for characterizing surface irradiation defects of ion-irradiated materials. The comparison between ECCI and conventional cross-sectional TEM for the observation of dislocation loops and helium (He) bubbles is analyzed in a common FeCoNiCr high-entropy alloy. The results indicate that the ECCI images of irradiation-induced defects are optimal at the extra-high tension of 20 kV, with a limit resolution of ∼1.5 nm for visible defects. The irradiation-induced dislocation loops show sharper contrast than bubbles in ECCI images, and the acceptable misorientation was within 4° of sample tilt. These findings offer a promising solution to the challenges for rapid assessment of irradiation damage in ion-irradiated materials.
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