Abstract
It is shown by numerical computations that self-similar index profiles imply self-similar mode spectra in planar waveguides. This leads to a simple method to estimate the diffusion activation energy and to evaluate the validity of Fick’s second law in diffusion modeling, under given processing condition, from measurements of mode spectra. The feasibility of the approach is verified experimentally with Na 2O–SiO 2–Al 2O 3–B 2O 3 glass developed for ion exchange processing.
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