Abstract
In this paper, the influences of the graphite precursor and the oxidation method on the resulting reduced graphene oxide (especially its composition and morphology) are shown. Three types of graphite were used to prepare samples for analysis, and each of the precursors was oxidized by two different methods (all samples were reduced by the same method of thermal reduction). Each obtained graphite oxide and reduced graphene oxide was analysed by X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS) and Raman spectroscopy (RS).
Highlights
Carbon-based materials are very interesting due to their stable physicochemical properties and low cost, as well as other characteristics [1]
All reduced graphene oxides were examined by the same methods as those employed for the graphite oxides, and X-ray diffraction (XRD) measurements were performed first
This work involved various advanced research methods that enable deeper analysis of the changes related to the incorporation of oxygen atoms into graphite oxides and reduced graphene oxides
Summary
Carbon-based materials are very interesting due to their stable physicochemical properties and low cost, as well as other characteristics [1]. These materials have been utilised in many applications, e.g., supercapacitors and thin film transistors [1,2,3]. One of the most interesting types of these carbon-based materials is reduced graphene oxide (rGO). This material can be used for many purposes e.g., in gas sensing structures [2,4,5]. The reduction step can be completed through several methods, such as the environmentally methods of flash photoreduction, hydrothermal, catalytic reduction and thermal annealing [7,12,13,14]
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