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Abstract
Optical phase-gradient metasurfaces, whose unique capabilities are based on the possibility to arbitrarily control the phase of reflected/transmitted light at the subwavelength scale, are seldom characterized with direct measurements of phase gradients. Using numerical simulations and experimental measurements, we exploit the technique of scanning differential heterodyne microscopy (SDHM) for direct phase and amplitude characterization of gap-plasmon based optical metasurfaces. Two metasurface configurations utilizing the third-order gap surface plasmon (GSP) resonance, representing a binary grating and linear phase gradient, are experimentally characterized with the SDHM operating at the light wavelength of 633 nm. Comparing the experimental performances of these GSP metasurfaces with those expected from the phase and amplitude profiles reconstructed from the SDHM measurements, we verify the efficiency and accuracy of the developed SDHM characterization approach for direct inspection of GSP reflective metasurfaces.
Highlights
Optical phase-gradient metasurfaces, whose unique capabilities are based on the possibility to arbitrarily control the phase of reflected/transmitted light at the subwavelength scale, are seldom characterized with direct measurements of phase gradients
We conduct experimental investigations of an alternative approach to the characterization of reflective metasurfaces that is based on the usage of scanning differential heterodyne microscopy (SDHM)
We perform the SDHM characterization at the light wavelength of 633 nm of two different metasurface configurations utilizing the third-order gap surface plasmon (GSP) r esonance[11], representing a binary grating and linear phase gradient
Summary
Optical phase-gradient metasurfaces, whose unique capabilities are based on the possibility to arbitrarily control the phase of reflected/transmitted light at the subwavelength scale, are seldom characterized with direct measurements of phase gradients. Two metasurface configurations utilizing the third-order gap surface plasmon (GSP) resonance, representing a binary grating and linear phase gradient, are experimentally characterized with the SDHM operating at the light wavelength of 633 nm. The most recently suggested technique, which involves scattering near-field optical microscopy with phase-resolved detection allowing for characterization of individual surface elements[9], has limitations associated with the necessity of back-side illumination of metasurfaces that would normally be illuminated from the front side This approach requires thereby the development of a special recalculation procedure when treating the experimentally obtained phase and amplitude distributions[9]. We perform the SDHM characterization at the light wavelength of 633 nm of two different metasurface configurations utilizing the third-order gap surface plasmon (GSP) r esonance[11], representing a binary grating and linear phase gradient. For the purpose of identifying specific imperfection areas in the fabricated reflective metasurfaces we suggest using the SDHM as a reliable and robust tool
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