Abstract
Results of structural, optical and electrical properties of flash-evaporated Hg 1− x Zn x Te films. in the composition range 0.08 ⩽ x ⩽ 1, show that the films are formed by alloying HgTe and ZnTe. The optical band gap of these films increases from 0.04 to 2.26 eV with an increase in Zn concentration from 0.08 to 1.0. The band gap variation is not linear but shows a “bowing effect” familiar to pseudobinary solid solutions. An increase in resistivity with an increase in the substrate temperature can be related to larger grain size at the higher substrate temperatures in these p-type films. The films exhibit higher conductivity for the Hg-rich films which decreases linearly as the Zn concentration is increased.
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