Abstract
The extrinsic hysteresis phenomena of a series combination of several Esaki-diode-like negative differential resistance (NDR) devices are modeled, simulated and demonstrated. The Esaki-diode-like device is defined to have a larger NDR value of the current–voltage (I–V) curve than the value of the main positive differential resistance. The analytical model is based on a load-line technique with a piecewise-linear approximation for the I–V curve of the NDR device. The results provide a useful design and estimation for the combined I–V characteristics of series-connected Esaki-diode-like NDR devices.
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