Abstract
Substrate and ion-bombardment effects on exchange bias were explored for CoFe/(Co,Fe)O bilayer films. The (Co,Fe)O component was sputtered onto different substrates and then ion-bombarded before a ferromagnetic CoFe layer was grown. Ferromagnetic resonance reveals that the CoFe is magnetically pinned by the (Co,Fe)O film. We find that substrate type heavily influences the magnitude of exchange bias and also the degree to which the exchange biased system is affected under ion-bombardment. In all cases there is a general decrease in the magnitude of exchange bias and coercivity, and for cases with high energy ion-bombardment unusual changes to the hysteresis loop are observed which may indicate the formation of an additional magnetic phase.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.