Abstract
Nondestructive Surface Acoustic Wave (SAW) technique is used to determine the storage lifetime of silicon p- n diode arrays. Diode arrays are extensively used in low light-level imaging and memory correlator devices. The electric fields that accompany the SAW in piezoelectrics (LiNbO 3) are used to alter or gauge the charge content of the diodes. The storage lifetime determined with this technique agrees with that using conventional techniques such as I-V and C-V.
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