Characterization of dielectric materials by the extension of voltage response method

Abstract

The voltage response method measures the decay and return voltages on a charged and shorted dielectric and from the slopes of these voltages the specific conductivity and the polarization conductivity of the material can be determined. These two numbers can characterize the main dielectric processes, namely the conductivity and the polarization, however the phenomenon of polarization is the sum of numerous elementary polarization processes with different intensities and time constants. By changing the shorting time of a charged insulation the elementary polarization processes can be examined separately and the whole polarization spectrum can be investigated more precisely. This paper introduces how the voltage response measurement technique is extended by the variation of discharging times and the mathematical model of the measurement is described. Measurements on a model dielectric and on a dielectric material were carried out and the results have been compared by the results of the calculations.