Abstract
Titanium thin film was prepared on copper substrate by thermal evaporation method. Gettering property of titanium film for deuterium was studied for different values of temperature, pressure and time. The studies were carried out in an ultra high vacuum system. The substrate was mounted in the vacuum system on a heater whose temperature was controlled by PID controller. The titanium thin film was activated for 1 h at a temperature of 500 °C under vacuum. After activation, during cool down, the vacuum chamber was pressurized at various pressure values of deuterium and left for absorption for various time periods. Comparative studies of the amount of deuterium desorption for various charging pressure and exposure time were studied with the help of residual gas analyzer. Attempts were made to qualify the process of deuteration of the titanium film. The results of these studies are presented in this article.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
